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Electron avalanche and surface charging on alumina insulators during pulsed high‐voltage stress

 

作者: J. P. Brainard,   Dal Jensen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1974)
卷期: Volume 45, issue 8  

页码: 3260-3265

 

ISSN:0021-8979

 

年代: 1974

 

DOI:10.1063/1.1663770

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This paper describes a model for insulator surface charging in high‐voltage ceramic vacuum diodes. The model involves electron emission from the insulator‐cathode‐vacuum junction followed by electron avalanches on the insulator surface which leave the wall positively charged. Experiments were performed to measure (i) the triple‐junction (cathode‐vacuum‐insulator interface) emission and its relation to the initiation of the avalanche, (ii) the dynamic current in the avalanche, and (iii) the saturated surface charge resulting from the avalanche. The experimental results were interpreted by computer simulation in terms of the model and were found to be in close agreement with the predictions.

 

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