Noncharacteristic Defects in Thin Films of Cobalt Ferrites
作者:
L. C. De Jonghe,
G. Thomas,
期刊:
Journal of Applied Physics
(AIP Available online 1970)
卷期:
Volume 41,
issue 12
页码: 4885-4889
ISSN:0021-8979
年代: 1970
DOI:10.1063/1.1658557
出版商: AIP
数据来源: AIP
摘要:
High‐voltage transmission electron microscopy has been used to study the structure of thin films of cobalt ferrites of various compositions. Small defects have been identified to result from a combination of chemical polishing used to prepare foils and subsequent radiation damage in the electron microscope. Such defects must be distinguished from the characteristic defects, such as small precipitates, since they are representative only of the preparation and examination techniques.
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