Inference About Defects in the Presence of Masking
作者:
BettyJ. Flehinger,
Benjamin Reiser,
Emmanuel Yashchin,
期刊:
Technometrics
(Taylor Available online 1996)
卷期:
Volume 38,
issue 3
页码: 247-255
ISSN:0040-1706
年代: 1996
DOI:10.1080/00401706.1996.10484504
出版商: Taylor & Francis Group
关键词: Competing causes;Partial information;Reliability;Success/failure data
数据来源: Taylor
摘要:
This article considers the situation in which a system consists ofkcomponents and a defect in any component causes a system malfunction. When a system malfunction occurs, test procedures restrict the cause to some subset of the Ic components. When that subset consists of more than one component, this phenomenon is termedmasking. Typically, masking introduces two types of problems. First, it is desirable to estimate the “diagnostic probability”—that is, the probability, given a specified malfunctioning subset, that each of the masked components is the defective one. Second, when a set of historical data contains masked information, one would like to use this information to estimate the defect probability of each individual component type. The article discusses these problems in detail and derives two-stage procedures for estimation and inference.
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