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Scanning tunneling microscope

 

作者: Sang‐il Park,   C. F. Quate,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 11  

页码: 2010-2017

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139508

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This article describes the design of a scanning tunneling microscope (STM) which is suitable for surface science work. Various concepts in mechanical structure and electronic circuitry of the STM have been pursued to optimize its performance. This STM has been designed especially to meet the requirement ofinsitusample preparation and sample transfer in ultrahigh vacuum. The electronics of this STM are capable of taking simultaneous images with opposite polarities of tunneling voltages.

 

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