Scanning tunneling microscope
作者:
Sang‐il Park,
C. F. Quate,
期刊:
Review of Scientific Instruments
(AIP Available online 1987)
卷期:
Volume 58,
issue 11
页码: 2010-2017
ISSN:0034-6748
年代: 1987
DOI:10.1063/1.1139508
出版商: AIP
数据来源: AIP
摘要:
This article describes the design of a scanning tunneling microscope (STM) which is suitable for surface science work. Various concepts in mechanical structure and electronic circuitry of the STM have been pursued to optimize its performance. This STM has been designed especially to meet the requirement ofinsitusample preparation and sample transfer in ultrahigh vacuum. The electronics of this STM are capable of taking simultaneous images with opposite polarities of tunneling voltages.
点击下载:
PDF
(770KB)
返 回