Electrostatic and contact forces in force microscopy
作者:
Huang Wen Hao,
A. M. Baró,
J. J. Sáenz,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1991)
卷期:
Volume 9,
issue 2
页码: 1323-1328
ISSN:1071-1023
年代: 1991
DOI:10.1116/1.585188
出版商: American Vacuum Society
关键词: ATOMIC FORCE MICROSCOPY;GRAPHITE;SURFACE FORCES;INTERFEROMETERS;MEASURING METHODS;CONTACT PROBLEMS;ADHESION;TIPS
数据来源: AIP
摘要:
We have been measuring the electrostatic and contact forces between a tip and a graphite surface in a force microscope, which uses a polarizing optical interferometer. For large distances where the electrostatic force predominates, the data are analyzed in terms of a model which introduces the elongated shape of an actual tip. We find that the macroscopic tip has to be taken into account when analyzing the experimental data. The model allows us to deduce the effective radius of the tip which is operative in the electrostatic interaction. We also analyze the contact problem. The attractive part is consistent with van der Waals (vdW) forces. The repulsive regime shows an anomalously small level deflection which is attributed to the deformation of the sample surface. The adhesion of the tip sample is also measured.
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