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On the application of one‐wavelength anomalous scattering. IV. The absolute configuration of the anomalous scatterers

 

作者: M. M. Woolfson,   J. Yao,  

 

期刊: Acta Crystallographica Section D  (WILEY Available online 1994)
卷期: Volume 50, issue 1  

页码: 7-10

 

ISSN:1399-0047

 

年代: 1994

 

DOI:10.1107/S0907444993008091

 

出版商: International Union of Crystallography

 

数据来源: WILEY

 

摘要:

An essential first step in most techniques for using anomalous‐scattering data for phase determination is to determine the positions of the anomalous scatterers. This is usually done by use of the anomalous differences, either as input to a direct‐methods procedure or to produce a Patterson map. If the arrangement of anomalous scatterers is noncentrosymmetric then it is also necessary to find their absolute configuration and a process is described for doing this based on the properties of thePsfunction [Okaya, Saito&Pepinsky (1955).Phys. Rev.98, 1857–1858]. If the arrangement of anomalous scatterers is centrosymmetric then the problem does not

 

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