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Preparation of magnetic tips for a scanning force microscope

 

作者: A. J. den Boef,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 20  

页码: 2045-2047

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.102991

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple technique for peparing magnetic tips used in a scanning force microscope is described. In this technique a thin layer of ferromagnetic material is deposited on an etched tungsten tip via sputtering or galvanic deposition. Images of magnetic domains obtained with these tips are presented, demonstrating a lateral resolution of the order of 50–100 nm.

 

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