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A review of fault models for lsi/vlsi devices

 

作者: SilvanoGai,   MarcoMezzalama,   PaoloPrinetto,  

 

期刊: Software & Microsystems  （IET Available online 1983）
卷期: Volume 2, issue 2  

页码: 44-53

 

年代: 1983

 

DOI:10.1049/sm.1983.0016

 

出版商: IEE

 

数据来源: IET

 

摘要:

The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs

 

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