Insitureflectivity monitoring of antireflection coatings on semiconductor laser facets through facet loss induced forward voltage changes
作者:
Jean Landreau,
Hisao Nakajima,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 24
页码: 2376-2378
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102920
出版商: AIP
数据来源: AIP
摘要:
Insitufully electrical monitoring of the reflectivity of antireflection coatings on semiconductor laser facets is experimentally demonstrated. The operating principle consists of detecting changes in the forward voltage drop induced by the modification of facet reflectivity of a constant current‐driven semiconductor laser. This technique allows one to detect the optimum thickness giving the lowest reflectivity without optical measurement. A reflectivity as low as 1×10−4was currently obtained with electron beam deposited SiOxfilms on 1.5 &mgr;m buried ridge stripe lasers.
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