作者: William R. Savage,
期刊: Journal of Applied Physics (AIP Available online 1962) 卷期: Volume 33, issue 11
页码: 3198-3201
ISSN:0021-8979
年代: 1962
DOI:10.1063/1.1931136
出版商: AIP
数据来源: AIP
摘要:
The high-field electron emission projection microscope has been used to study the field emission characteristicsof cadmium telluride field emission cathodes. Stable currents were observed which exhibited lightsensitive changes.
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