Diffraction determination of the structure of metastable three‐dimensional crystals of Ge grown on Si(001)
作者:
C. E. Aumann,
Y.‐W. Mo,
M. G. Lagally,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 9
页码: 1061-1063
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.106345
出版商: AIP
数据来源: AIP
摘要:
A straightforward kinematic analysis of diffraction from metastable three‐dimensional crystallites of Ge grown on Si(001) is presented. Low‐energy electron diffraction data from these crystallites agree with diffraction images calculated for a structure determined from scanning‐tunneling microscopy data. Additionally, reflection high‐energy electron diffraction images predicted for these crystals agree with existing data.
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