X-ray diffraction from corrugated crystalline surfaces and interfaces
作者:
A. T. Macrander,
S. E. G. Slusky,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 5
页码: 443-445
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102759
出版商: AIP
数据来源: AIP
摘要:
Satellite peaks analogous to superlattice peaks have been observed for both corrugated InP substrates and for such substrates overgrown with epitaxial InGaAsP. These satellites are entirely due to the corrugations. High-resolution x-ray diffraction using extremely asymmetric reflections in the glancing exit configuration was used. A kinematical expression for the intensities of the satellite peaks is derived for strain-free structures.
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