首页   按字顺浏览 期刊浏览 卷期浏览 X-ray diffraction from corrugated crystalline surfaces and interfaces
X-ray diffraction from corrugated crystalline surfaces and interfaces

 

作者: A. T. Macrander,   S. E. G. Slusky,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 5  

页码: 443-445

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.102759

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Satellite peaks analogous to superlattice peaks have been observed for both corrugated InP substrates and for such substrates overgrown with epitaxial InGaAsP. These satellites are entirely due to the corrugations. High-resolution x-ray diffraction using extremely asymmetric reflections in the glancing exit configuration was used. A kinematical expression for the intensities of the satellite peaks is derived for strain-free structures.

 

点击下载:  PDF (300KB)



返 回