作者: C. D. Gutleben,
期刊: Applied Physics Letters (AIP Available online 1997) 卷期: Volume 71, issue 23
页码: 3444-3446
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120402
出版商: AIP
数据来源: AIP
摘要:
In situx-ray photoelectron spectroscopy was used to determine the band alignments of the platinum toSrBi2Ta2O9contact. The interfaces were prepared by incremental evaporation of Pt onto a vacuum/O2annealed polycrystalline surface grown by the sol-gel method. The results track the development of the band alignments from the submonolayer to the thick metal-film regimes. The Fermi level to ferroelectric valence-band offset of the asymptotic full metal contact was found to be 2.9 eV. The contact was also clearly shown to be highly disrupted with a bismuth-platinum alloy forming at the interface. ©1997 American Institute of Physics.
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