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Electromechanical properties ofSrBi2Ta2O9thin films

 

作者: A. L. Kholkin,   K. G. Brooks,   N. Setter,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 14  

页码: 2044-2046

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119782

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Weak field piezoelectric coefficient and strain were investigated in ferroelectricSrBi2Ta2O9(SBT) thin films by means of optical interferometry. Though the maximum polarization and dielectric constant were small enough (7&mgr;C/cm2and 150, respectively), the piezoelectric coefficient attained 17 pm/V under the dc electric field. This value is comparable with the piezoelectric coefficients reported previously on poled SBT ceramics. Electrically induced strain of5⋅10−4was observed using bipolar driving field of 300 kV/cm. No piezoelectric fatigue was found until109switching pulses, in agreement with polarization data. The piezoelectric properties and strains were successfully described by using a simple electrostriction equation with the effective electrostriction coefficient of 0.1m4/C2.The electromechanical behavior of SBT films suggested no or weak contribution of non-180° domain walls to the strain response. ©1997 American Institute of Physics.

 

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