Electroreflectance, photoreflectance, and photoabsorption properties of polycrystalline CdTe thin films prepared by the gradient recrystallization and growth technique
作者:
C. Va´zquez‐Lo´pez,
H. Navarro,
Rau´l Aceves,
M. C. Vargas,
Cornelius A. Menezes,
期刊:
Journal of Applied Physics
(AIP Available online 1985)
卷期:
Volume 58,
issue 5
页码: 2066-2069
ISSN:0021-8979
年代: 1985
DOI:10.1063/1.335965
出版商: AIP
数据来源: AIP
摘要:
In this work we report electroreflectance, photoreflectance, and photoabsorption measurements on CdTe polycrystalline thin films. These thin films were prepared by the gradient recrystallization and growth technique. The measurements were performed around the fundamental energy gap of the semiconductor at room temperature. The energy gap of this polycrystalline material coincides with that corresponding to the single‐crystal material, and the phenomenological energy broadening parameter is larger than that corresponding to the single‐crystal semiconductor by a factor of three, approximately. The photoabsorption signal is obtained by studying the origin of a low‐energy peak which appears in the photoreflectance spectrum.
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