首页   按字顺浏览 期刊浏览 卷期浏览 Growth and characterization of thinSi80C20films based uponSi4Cbuilding blocks
Growth and characterization of thinSi80C20films based uponSi4Cbuilding blocks

 

作者: J. Kouvetakis,   D. Chandrasekhar,   David J. Smith,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 8  

页码: 930-932

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120876

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The growth of thinSi80C20diamond-structured material on (100)Si has been achieved using the novel C–H free, carbon source tetrasilyl methane,C(SiH3)4.The precursor decomposes at temperatures in the range 600–700 °C to give thin amorphous layers with a composition ofSi0.80C0.20,which corresponds to the same relative concentrations of Si and C as in the precursor. The amorphous material is crystallized via solid-phase epitaxy by annealing at 825 °C to yield a potentially ordered structure in whichSi4Ctetrahedra are linked together in a three-dimensional diamond-cubic framework. Measured lattice parameters are larger than expected from Vegards’ Law, a discrepancy which is attributed to steric repulsions causing bond elongation. ©1998 American Institute of Physics.

 

点击下载:  PDF (294KB)



返 回