Optical characterization of AlInGaAs/InGaAs quantum well structures on InGaAs substrates
作者:
L. Jedral,
C. Edirisinghe,
H. Ruda,
A. Moore,
B. Lent,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 1
页码: 375-379
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365822
出版商: AIP
数据来源: AIP
摘要:
We report on photoluminescence and photoreflectance studies of metalorganic chemical vapor deposition grown InGaAs/InGaAlAs quantum well structures on lattice matched InGaAs substrates. The optical characteristics of the substrates are also discussed. The quantum wells exhibit a high degree of relaxation, despite their thickness being below the critical values, which may be related to the growth conditions. A correlation was found between the optical characteristics and the quality of the layer structures grown on the InGaAs substrates. ©1997 American Institute of Physics.
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