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Optical characterization of AlInGaAs/InGaAs quantum well structures on InGaAs substrates

 

作者: L. Jedral,   C. Edirisinghe,   H. Ruda,   A. Moore,   B. Lent,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 1  

页码: 375-379

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.365822

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on photoluminescence and photoreflectance studies of metalorganic chemical vapor deposition grown InGaAs/InGaAlAs quantum well structures on lattice matched InGaAs substrates. The optical characteristics of the substrates are also discussed. The quantum wells exhibit a high degree of relaxation, despite their thickness being below the critical values, which may be related to the growth conditions. A correlation was found between the optical characteristics and the quality of the layer structures grown on the InGaAs substrates. ©1997 American Institute of Physics.

 

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