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Electron Microscopy of Prismatic Dislocations in Silicon

 

作者: V. A. Phillips,   W. C. Dash,  

 

期刊: Journal of Applied Physics  （AIP Available online 1962）
卷期: Volume 33, issue 2  

页码: 568-569

 

ISSN:0021-8979

 

年代: 1962

 

DOI:10.1063/1.1702467

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Transmission electron micrographs of (111) prismatic loops in gold‐diffused silicon have been obtained. The loops were about 2 &mgr; in diameter. From the contrast effects seen and for a number of other reasons it is concluded that the loops surround a stacking fault rather than coherent platelets of gold.

 

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