A two‐stage sampling plan for bogey tests
作者:
C. Julius Wang,
Ming‐Wei Lu,
期刊:
Quality and Reliability Engineering International
(WILEY Available online 1992)
卷期:
Volume 8,
issue 1
页码: 29-35
ISSN:0748-8017
年代: 1992
DOI:10.1002/qre.4680080106
出版商: Wiley Subscription Services, Inc., A Wiley Company
关键词: Weibull distribution;Accelerated life test;Reliability demonstration;Bogey test;Sampling plan;Type I censoring;Confidence level
数据来源: WILEY
摘要:
AbstractWhen accelerated life tests can be applied to simulate the normal product operating conditions, engineers usually terminate the test upon successfully running to a multiple of a prespecified bogey without any failure to demonstrate a required minimum reliability level. This testing philosophy is called ‘bogey test’ (or extended test) in the automotive industry and is a subset of type I censored tests in standard reliability literature. Sometimes engineers encounter the difficulty of using this reliability demonstration approach when incidents do occur during the test. The incident might be a legitimate failure or a withdrawal caused by external forces such as a broken fixture of a non‐functional power supply. This paper derives a two‐stage sampling plan for possible back‐up solution on planning and running a bogey test with possible occurrence of incidents. A Weibull distribution with a given shape parameter is assumed for the underlying life chara
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