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A reflection high-energy electron diffraction and atomic force microscopy study of the chemical beam epitaxial growth of InAs and InP islands on (001) GaP

 

作者: B. Junno,   T. Junno,   M. S. Miller,   L. Samuelson,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 8  

页码: 954-956

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120883

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have studied the formation of strained InAs and InP island structures on GaP surfaces grown by chemical beam epitaxy. InP grows pseudomorphically for 3 ML before island crystallization is observed by reflection high-energy electron diffraction, following a typical Stranski–Krastanov growth mode. For the growth of InAs on GaP, three-dimensional diffraction peaks are observed after 0.9 ML of InAs have been deposited, indicating a Volmer–Weber growth mode. Atomic force microscopy studies of these structures are presented and the optical properties are discussed. ©1998 American Institute of Physics.

 

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