A reflection high-energy electron diffraction and atomic force microscopy study of the chemical beam epitaxial growth of InAs and InP islands on (001) GaP
作者:
B. Junno,
T. Junno,
M. S. Miller,
L. Samuelson,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 8
页码: 954-956
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120883
出版商: AIP
数据来源: AIP
摘要:
We have studied the formation of strained InAs and InP island structures on GaP surfaces grown by chemical beam epitaxy. InP grows pseudomorphically for 3 ML before island crystallization is observed by reflection high-energy electron diffraction, following a typical Stranski–Krastanov growth mode. For the growth of InAs on GaP, three-dimensional diffraction peaks are observed after 0.9 ML of InAs have been deposited, indicating a Volmer–Weber growth mode. Atomic force microscopy studies of these structures are presented and the optical properties are discussed. ©1998 American Institute of Physics.
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