Two‐dimensional electron gas modulated resonant tunneling transistor
作者:
K. F. Longenbach,
Y. Wang,
W. I. Wang,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 8
页码: 967-969
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.106317
出版商: AIP
数据来源: AIP
摘要:
Operation of a novel three‐terminal resonant tunneling device which consists of an AlGaAs/GaAs modulation‐doped structure grown on top of an AlAs/GaAs double‐barrier resonant tunneling heterostructure has been demonstrated. In this device, the drain‐to‐source voltage is used to directly control the bias across a resonant tunneling structure, while the gate voltage controls the number of carriers available for the tunneling process by modulating the density of carriers in a two‐dimensional electron gas. Device operation is demonstrated at 80 K as well as room temperature with peak current densities of 420 A/cm2and peak‐to‐valley ratios as high as 5:1. Operation into the hundred gigahertz range is predicted for an optimized device structure.
点击下载:
PDF
(373KB)
返 回