Evolution of the Si(100)‐2×2‐In reconstruction
作者:
A. A. Baski,
J. Nogami,
C. F. Quate,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1991)
卷期:
Volume 9,
issue 3
页码: 1946-1950
ISSN:0734-2101
年代: 1991
DOI:10.1116/1.577434
出版商: American Vacuum Society
关键词: INDIUM;LAYERS;SILICON;SURFACE RECONSTRUCTION;SCANNING ELECTRON MICROSCOPY;TUNNEL EFFECT;ULTRAHIGH VACUUM;ELECTRON DIFFRACTION;VAPOR DEPOSITED COATINGS;In
数据来源: AIP
摘要:
The 2×2 reconstruction of indium on the Si(100) 2×1 surface has been studied using scanning tunneling microscopy. For depositions below 150 °C, In lines up in rows perpendicular to the underlying Si dimer rows, with a two unit cell periodicity along each In row. In the 2×2 structure, these rows are spaced two unit cells apart. We investigate the evolution of the In(2×2) reconstruction from isolated rows at lowest coverage, to islands of 2×3 and 2×2 structure, to a surface entirely covered by 2×2 at 0.5 monolayers of In. The role of step edges in nucleating areas of In growth is also examined.
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