The sources of error in Hall-effect multipliers
作者:
A.R.Billings,
D.J.Lloyd,
期刊:
Proceedings of the IEE - Part B: Electronic and Communication Engineering
(IET Available online 1959)
卷期:
Volume 106,
issue 16S
页码: 706-713
年代: 1959
DOI:10.1049/pi-b-2.1959.0134
出版商: IEE
数据来源: IET
摘要:
The errors produced in a Hall-effect multiplier are examined and shown to belong to one of two categories: either they are due to coupling between input or output, or they are produced by non-linear processes within the device. An estimate of the magnitude of the errors is given and interpreted in terms of carrier leak, modulation leak and envelope distortion for the particular application of a Hall-effect modulator. A comparison is made between plates constructed of indium antimonide and indium arsenide on the bases of carrier suppression, temperature stability, conversion efficiency and distortion. Carrier suppressions of up to 80 dB can be obtained for both materials.
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