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A high‐intensity scanning ion probe with submicrometer spot size

 

作者: R. L. Seliger,   J. W. Ward,   V. Wang,   R. L. Kubena,  

 

期刊: Applied Physics Letters  (AIP Available online 1979)
卷期: Volume 34, issue 5  

页码: 310-312

 

ISSN:0003-6951

 

年代: 1979

 

DOI:10.1063/1.90786

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A liquid‐metal gallium‐ion source was imaged by unity‐magnification single‐gap accelerating lens with a postlens deflector to form a focused scanning probe. We report the dependence of the probe diameter and probe current on the lens acceptance half‐angle. The results range between probe diameters of 1000 and 5000 A˚ at currents of 0.12–3.0 nA for half‐angles of 1.2–6 mrad. The current density and brightness at the target for the 1000‐A˚‐diam 57‐kV probe were 1.5 A/cm2and 3.3×106A/cm2 sr, respectively. Astigmatic probes were also produced with dimensions smaller than 1000 A˚.

 

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