首页   按字顺浏览 期刊浏览 卷期浏览 Analysis of Intensities Obtainable Using Pinhole and Slit Collimators in X‐Ray P...
Analysis of Intensities Obtainable Using Pinhole and Slit Collimators in X‐Ray Powder Diffraction Techniques

 

作者: Leroy Alexander,  

 

期刊: Journal of Applied Physics  (AIP Available online 1950)
卷期: Volume 21, issue 8  

页码: 779-782

 

ISSN:0021-8979

 

年代: 1950

 

DOI:10.1063/1.1699757

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Other factors being equal, the integrated intensity of a powder diffraction reflection is a function of the geometry of the source, collimator, and sample. By means of a geometrical and algebraic analysis one can predict the relative intensities to be expected with pinhole or slit collimators of different dimensions. Important gains in intensity can be obtained by replacing pinholes with slits, and the advantage is about the same if the x‐ray focal spot is viewed either longitudinally or laterally through slits of sufficient length. These results confirm experimental results reported by other investigators and also re‐emphasize the potential value of the ``side'' windows of x‐ray tubes, which are commonly neglected.

 

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