Source of low‐energy hydrogen ions for measuring electron transfer in surface scattering experiments
作者:
J. D. Isenberg,
H. J. Kwon,
M. Seidl,
期刊:
Review of Scientific Instruments
(AIP Available online 1992)
卷期:
Volume 63,
issue 11
页码: 5289-5293
ISSN:0034-6748
年代: 1992
DOI:10.1063/1.1143441
出版商: AIP
数据来源: AIP
摘要:
We present the design and performance of a beamline which is the source of 5–50‐eV protons for surface scattering experiments. The beamline also incorporates a collector for measuring total secondary ion and electron yields. The beam forming optics are built around a commercially available gas discharge ion gun and produce a mass‐selected, energy‐filtered beam. Results of computer ray tracing are included to illustrate the operation of the beam optics. Tests have produced 50‐pA proton beams 3.5‐mm wide at 5 eV with an energy spread of about 1 eV.
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