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Source of low‐energy hydrogen ions for measuring electron transfer in surface scattering experiments

 

作者: J. D. Isenberg,   H. J. Kwon,   M. Seidl,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1992)
卷期: Volume 63, issue 11  

页码: 5289-5293

 

ISSN:0034-6748

 

年代: 1992

 

DOI:10.1063/1.1143441

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present the design and performance of a beamline which is the source of 5–50‐eV protons for surface scattering experiments. The beamline also incorporates a collector for measuring total secondary ion and electron yields. The beam forming optics are built around a commercially available gas discharge ion gun and produce a mass‐selected, energy‐filtered beam. Results of computer ray tracing are included to illustrate the operation of the beam optics. Tests have produced 50‐pA proton beams 3.5‐mm wide at 5 eV with an energy spread of about 1 eV.

 

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