Reduction of relative intensity noise in 1.3 &mgr;m InGaAsP semiconductor lasers
作者:
P. Hill,
R. Olshansky,
J. Schlafer,
W. Powazinik,
期刊:
Applied Physics Letters
(AIP Available online 1987)
卷期:
Volume 50,
issue 20
页码: 1400-1402
ISSN:0003-6951
年代: 1987
DOI:10.1063/1.97833
出版商: AIP
数据来源: AIP
摘要:
Relative intensity noise (RIN) from 1.3 &mgr;m InGaAsP vapor phase regrown buried heterostructure diode lasers with cavity lengths of 100–300 &mgr;m and resonant frequencies exceeding 15 GHz is measured for the first time over the 2.5–18 GHz frequency range. We show that the RIN decreases by nearly 8 dB as the cavity length increases from 100 to 300 &mgr;m, and that the RIN is also reduced by lowering the activep‐doping concentration. The measured RIN is in excellent agreement with the expression derived from the laser rate equations.
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