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Reduction of relative intensity noise in 1.3 &mgr;m InGaAsP semiconductor lasers

 

作者: P. Hill,   R. Olshansky,   J. Schlafer,   W. Powazinik,  

 

期刊: Applied Physics Letters  (AIP Available online 1987)
卷期: Volume 50, issue 20  

页码: 1400-1402

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.97833

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Relative intensity noise (RIN) from 1.3 &mgr;m InGaAsP vapor phase regrown buried heterostructure diode lasers with cavity lengths of 100–300 &mgr;m and resonant frequencies exceeding 15 GHz is measured for the first time over the 2.5–18 GHz frequency range. We show that the RIN decreases by nearly 8 dB as the cavity length increases from 100 to 300 &mgr;m, and that the RIN is also reduced by lowering the activep‐doping concentration. The measured RIN is in excellent agreement with the expression derived from the laser rate equations.

 

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