Neutralization and ionization of low energy helium ions scattering from a copper surface
作者:
L.K. Verheij,
B. Poelsema,
A.L. Boers,
期刊:
Radiation Effects
(Taylor Available online 1977)
卷期:
Volume 34,
issue 4
页码: 163-168
ISSN:0033-7579
年代: 1977
DOI:10.1080/00337577708233144
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Ion yield measurements are presented |of 2–10 keV helium ions scattered from a copper (100) face. The scattering angle is 30°. The results are explained using a charge transfer model originally proposed by the authors. The model takes into account Auger neutralization as well as ionization and neutralization resulting from a violent collision. The present results are compared with previous] experiments in which a primary atom beam was used. Within the experimental errors the results |of both experiments can be explained using the same charge exchange parameters. A second result of the present investigation is that more convincing evidence is given for the occurrence of neutralization during the violent collision by a non-Auger process. It is probable that this process, as well as the ionization process, results from an interaction between the helium particle and the copper L shell electrons.
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