A sciopticon based on the pinhole‐camera effect is being used to determine individual beamlet contributions to the quality of neutral beams extracted from multiaperture ion sources. The technique outlined in this note can be used to study the effects on beam optics of nonhomogeneous source plasma density or acceleration gap nonuniformities, grid nonparallelism or aperture misplacement, and space‐charge blowup or scattering in the neutralizer cell.