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A simpleinsitucalibration technique for soft x‐ray film

 

作者: Pei‐xiang Lu,   Pin‐zhong Fan,   Zhi‐zhan Xu,   Ru‐xin Li,   Xiao‐fang Wang,   Yue‐lin Li,   Zheng‐quan Zhang,   Shi‐sheng Chen,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1993）
卷期: Volume 64, issue 10  

页码: 2879-2882

 

ISSN:0034-6748

 

年代: 1993

 

DOI:10.1063/1.1144376

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple validinsiturelative intensity calibration technique for soft x‐ray film is described. This is based on film exposure measurements of the uniform line‐shaped distributed soft x‐ray monochromatic irradiation transmitted through a step‐wedge absorption filter. Fitting the calibration data with Henke’s semiempirical equation for thick‐emulsion film, the characteristic curves for Shanghai 5F soft x‐ray film without supercoat (SIOM‐5FW) have been obtained in the wavelength region from 50 to 80 A˚.

 

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