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An Improved X‐Ray Tube for Diffraction Analysis

 

作者: R. R. Machlett,  

 

期刊: Journal of Applied Physics  (AIP Available online 1942)
卷期: Volume 13, issue 6  

页码: 398-401

 

ISSN:0021-8979

 

年代: 1942

 

DOI:10.1063/1.1714884

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A new x‐ray tube for diffraction analysis has been produced which affords much greater x‐ray beam intensity than has been possible with previous designs. In addition the purity of the x‐ray spectrum is insured. The new tube employs thin sheets of malleable beryllium, produced by additions of minute amounts of titanium, for windows in the metal tube wall. The low inherent absorption of such windows and their electrical and mechanical sturdiness are factors in the improvement in beam intensity. A shockproof form of the new diffraction analysis tube is also described.

 

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