Direct measurement of ZnGeP2birefringence from 0.66 to 12.2 &mgr;m using polarized light interference
作者:
D. W. Fischer,
M. C. Ohmer,
P. G. Schunemann,
T. M. Pollak,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 77,
issue 11
页码: 5942-5945
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.359175
出版商: AIP
数据来源: AIP
摘要:
The birefringence (&Dgr;n) of ZnGeP2has been measured directly from polarized light interference spectra obtained in transmittance over the 0.66–12 &mgr;m wavelength range from samples of six different thicknesses. The &Dgr;nvalues were determined from the positions of fringe maxima (&Dgr;n=k&lgr;/t) and then compared to previously published data which were obtained by a different technique. It was found that the interference fringe method results in values of &Dgr;naccurate to ±0.00005. The data are shown to exhibit much less scatter as a function of wavelength than previous results and can lead to more accurate calculations of phase‐matching angles for second‐harmonic generation applications. ©1995 American Institute of Physics.
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