首页   按字顺浏览 期刊浏览 卷期浏览 Direct measurement of ZnGeP2birefringence from 0.66 to 12.2 &mgr;m using polarized ligh...
Direct measurement of ZnGeP2birefringence from 0.66 to 12.2 &mgr;m using polarized light interference

 

作者: D. W. Fischer,   M. C. Ohmer,   P. G. Schunemann,   T. M. Pollak,  

 

期刊: Journal of Applied Physics  (AIP Available online 1995)
卷期: Volume 77, issue 11  

页码: 5942-5945

 

ISSN:0021-8979

 

年代: 1995

 

DOI:10.1063/1.359175

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The birefringence (&Dgr;n) of ZnGeP2has been measured directly from polarized light interference spectra obtained in transmittance over the 0.66–12 &mgr;m wavelength range from samples of six different thicknesses. The &Dgr;nvalues were determined from the positions of fringe maxima (&Dgr;n=k&lgr;/t) and then compared to previously published data which were obtained by a different technique. It was found that the interference fringe method results in values of &Dgr;naccurate to ±0.00005. The data are shown to exhibit much less scatter as a function of wavelength than previous results and can lead to more accurate calculations of phase‐matching angles for second‐harmonic generation applications. ©1995 American Institute of Physics.

 

点击下载:  PDF (543KB)



返 回