Optical characterization of InGaAs–GaAs multiple quantum wells using variable angle spectroscopic ellipsometry for designing tunable modulators
作者:
S. K. Cheung,
H. Wang,
W. Huang,
F. Jain,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 1
页码: 497-501
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.364125
出版商: AIP
数据来源: AIP
摘要:
Variable angle spectroscopic ellipsometry (VASE) technique is used to measure the optical constants of InGaAs/GaAs multiple quantum well (MQW) structures for the purpose of designing tunable optical modulators. The VASE measurements also include field-induced changes in index of refraction and absorption. These measured changes in MQWs are in agreement with theoretical computations. In addition, the design and simulated performance of an InGaAs/GaAs MQWs Fabry–Perot modulator using the VASE data is presented. ©1997 American Institute of Physics.
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