Study on gradual reversal of polarization in ferroelectric PZT thin films for adaptive-learning MFSFET applications
作者:
N. Tanisake,
K. Itani,
K.H. Kim,
E. Tokumitsu,
H. Ishiwara,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1995)
卷期:
Volume 6,
issue 1-4
页码: 69-80
ISSN:1058-4587
年代: 1995
DOI:10.1080/10584589508019354
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
We have studied partial switching characteristics of ferroelectric PZT thin films prepared by sol-gel technique for adaptive-learning MFSFET (Metal/Ferroelectrics/Semi-conductor Field Effect Transistor)applications. In this application, learning or initialization process can be realized by gradual reversal of polarization of the ferroelectric gate insulators. It is demonstrated that the polarization of PZT films can be gradually reversed by applying positive pulses to the MFM (Metal/ Ferroelectrics/Metal) capacitors and can be restored by negative short applying as the same.
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