作者: A. Fartash,
期刊: Applied Physics Letters (AIP Available online 1995) 卷期: Volume 67, issue 26
页码: 3901-3903
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115311
出版商: AIP
数据来源: AIP
摘要:
High‐quality C60(111) overlayers are grown on Au(111)/Ag(111)/mica substrates and their structures studied by x‐ray diffraction. The structural evolution of these overlayers is investigated for growth temperatures from 120 to 290 °C. C60(111) overlayers undergo an in‐plane orientational reordering atTo∼150 °C. Above this temperature, the rotated and commensurate in‐plane structures coexist with each other. The rotated structures evolve from the in‐plane structures, which predominate at temperatures belowTo. ©1996 American Institute of Physics.
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