Epitaxial planarization of patterned yttria‐stabilized zirconia substrates for multilayer structures
作者:
Bertha P. Chang,
Neville Sonnenberg,
Michael J. Cima,
Jonathan Z. Sun,
Lock See Yu‐Jahnes,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 8
页码: 1148-1150
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114990
出版商: AIP
数据来源: AIP
摘要:
Insituplanarization of epitaxial films has been demonstrated. This is a critical technology for the processing of any epitaxial multilayer device. Ion beam assisted deposition (IBAD) has been used to planarize patterned yttria‐stabilized ZrO2(YSZ)(001) substrates using YSZ films. X‐ray diffraction measurements have shown that the IBAD YSZ grows homoepitaxially. The IBAD planarization mechanism has similarities to those previously observed for rf bias sputtering. Critical current densities of up to 7×105A/cm2at 77 K have been measured for Ba2YCu3O7−x(BYC) films deposited on planarized patterned YSZ substrates using pulsed laser deposition. In contrast, BYC deposited on unplanarized patterned YSZ substrates did not become fully superconducting for measurements down to 25 K. ©1995 American Institute of Physics.
点击下载:
PDF
(226KB)
返 回