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Creep of 6H α‐Silicon Carbide Single Crystals

 

作者: Gregory S. Corman,  

 

期刊: Journal of the American Ceramic Society  (WILEY Available online 1992)
卷期: Volume 75, issue 12  

页码: 3421-3424

 

ISSN:0002-7820

 

年代: 1992

 

DOI:10.1111/j.1151-2916.1992.tb04444.x

 

出版商: Blackwell Publishing Ltd

 

数据来源: WILEY

 

摘要:

The compressive creep behavior of single‐crystal 6H α‐SiC was measured for orientations parallel to and at 45° to [0001]. Deformation of the 45° orientation was dominated by basal slip. Steady‐state creep rates above 10‐7/s were measured at temperatures as low as 800°C. An activation energy of 277 kJ/mol and a stress exponent of 3.32 were determined. Creep testing with applied stresses parallel to [0001] was performed at 1650°C to 1850°C, yielding a stress exponent and activation energy of 4.93 and 180 kJ/mol, respectively. The occurrence of basal slip in the [0001]specimens suggested that significant off‐axis stresses were present

 

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