Drift elimination in the calibration of scanning probe microscopes
作者:
R. Staub,
D. Alliata,
C. Nicolini,
期刊:
Review of Scientific Instruments
(AIP Available online 1995)
卷期:
Volume 66,
issue 3
页码: 2513-2516
ISSN:0034-6748
年代: 1995
DOI:10.1063/1.1145650
出版商: AIP
数据来源: AIP
摘要:
Calibration of scanning probe microscopes (SPM) for atomic (molecular) resolution scans can be carried out on crystalline surfaces. However, SPM scans with atomic resolution are often affected by drift and hence would give false calibration factors. We propose a method which allows to calibrate the SPM instrument eliminating the effects of drift in a first‐order approximation. Scans of the same surface are taken at different speeds and a linear regression is applied to the calibration factors calculated for each scan speed. Applying this method we succeeded in calibrating a commercial SPM system for atomic resolution scans with a precision of better than 2%. ©1995 American Institute of Physics.
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