首页   按字顺浏览 期刊浏览 卷期浏览 Hardness measurement of thin films: Separation from composite hardness
Hardness measurement of thin films: Separation from composite hardness

 

作者: J. L. He,   W. Z. Li,   H. D. Li,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 10  

页码: 1402-1404

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117595

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A composite hardness model based on the function of depth weight factor is presented. The model can be applied to determine the characteristic hardness of surface coatings which are too thin for the hardness to be directly measured. Its application requires only composite hardness data obtained from coated specimens by conventional microhardness measurement. DLC, TiN, and Cu films on substrates of glass, silicon, and AISI 52100 steel were used to verify this composite hardness model. It proved valid for a variety of cases. ©1996 American Institute of Physics.

 

点击下载:  PDF (91KB)



返 回