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Determination of thermal parameters of microbolometers using a single electrical measurement

 

作者: X. Gu,   G. Karunasiri,   G. Chen,   U. Sridhar,   B. Xu,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 15  

页码: 1881-1883

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121214

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Accurate determination of thermal parameters of microbolometer-based sensors is of considerable interest for many applications. The most important parameters are thermal time constant, heat capacitance and thermal conductance. In this work, we have developed a technique to measure all three quantities using a single electrical measurement. The method involves the measurement of time dependent output voltage of a balanced Wheatstone bridge containing a microbolometer under pulse bias condition. The validity of the approach is verified experimentally using metal–film microbolometers. The experimental results are in excellent agreement with the theoretical analysis of the measurement technique.©1998 American Institute of Physics.

 

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