Observation and analysis of conductance oscillations in scanning tunneling microscopy of clean InP(110) surfaces
作者:
N. S. McAlpine,
D. Haneman,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 78,
issue 9
页码: 5820-5821
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.359645
出版商: AIP
数据来源: AIP
摘要:
We have observed oscillations in the differential conductance as a function of the width of the tunneling barrier formed between the tip of a scanning tunneling microscope and a clean cleaved InP(110) surface. The oscillations were analyzed in terms of a simple model for a field emitted tunneling current that experiences a finite reflectivity at the InP(110) surface due to the step in the potential at the sample side of the tunneling barrier. Oscillations were not found at high bias in accord with the energy dependence of the reflectivity, and quantitative agreement was found between the model‐implied value of the surface work function and reported data. ©1995 American Institute of Physics.
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