New generalization of process capability index Cpk
作者:
W. L. Pearn,
期刊:
Journal of Applied Statistics
(Taylor Available online 1998)
卷期:
Volume 25,
issue 6
页码: 801-810
ISSN:0266-4763
年代: 1998
DOI:10.1080/02664769822783
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The process capability index Cpk has been widely used in manufacturing industry to provide numerical measures of process potential and performance. As noted by many quality control researchers and practitioners, Cpk is yield-based and is independent of the target T. This fails to account for process centering with symmetric tolerances, and presents an even greater problem with asymmetric tolerances. To overcome the problem, several generalizations of Cpk have been proposed to handle processes with asymmetric tolerances. Unfortunately, these generalizations understate or overstate the process capability in many cases, so reflect the process potential and performance inaccurately. In this paper, we first introduce a new index Cp"k, which is shown to be superior to the existing generalizations of Cpk. We then investigate the statistical properties of the natural estimator of Cp"k, assuming that the process is normally distributed.
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