System-Based Component-Test Plans and Operating Characteristics: Binomial Data
作者:
RobertG. Easterling,
Mainak Mazumdar,
FloydW. Spencer,
KathleenV. Diegert,
期刊:
Technometrics
(Taylor Available online 1991)
卷期:
Volume 33,
issue 3
页码: 287-298
ISSN:0040-1706
年代: 1991
DOI:10.1080/00401706.1991.10484835
出版商: Taylor & Francis Group
关键词: Component testing;Reliability allocation;System reliability
数据来源: Taylor
摘要:
Component-test plans are often designed by allocating system reliability among the system's components, then choosing individual component plans suitable for demonstrating achievcment of each component's reliability goal. This approach does not consider how much information relative to the system reliability goal is provided by the ensemble of component tests. We consider the notion of system reliability operating characteristic (OC) curves, based on the component tests, and illustrate their use in designing or evaluating an overall test program. By specifying OC values (akin to producer's and consumer's risks), optimum, system-ortented component-test plans can be derived. These ideas are illustrated for a series system, and for a simple series-parallel system, with binomial data.
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