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System-Based Component-Test Plans and Operating Characteristics: Binomial Data

 

作者: RobertG. Easterling,   Mainak Mazumdar,   FloydW. Spencer,   KathleenV. Diegert,  

 

期刊: Technometrics  (Taylor Available online 1991)
卷期: Volume 33, issue 3  

页码: 287-298

 

ISSN:0040-1706

 

年代: 1991

 

DOI:10.1080/00401706.1991.10484835

 

出版商: Taylor & Francis Group

 

关键词: Component testing;Reliability allocation;System reliability

 

数据来源: Taylor

 

摘要:

Component-test plans are often designed by allocating system reliability among the system's components, then choosing individual component plans suitable for demonstrating achievcment of each component's reliability goal. This approach does not consider how much information relative to the system reliability goal is provided by the ensemble of component tests. We consider the notion of system reliability operating characteristic (OC) curves, based on the component tests, and illustrate their use in designing or evaluating an overall test program. By specifying OC values (akin to producer's and consumer's risks), optimum, system-ortented component-test plans can be derived. These ideas are illustrated for a series system, and for a simple series-parallel system, with binomial data.

 

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