Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy
作者:
Charles Hubert,
Jeremy Levy,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 73,
issue 22
页码: 3229-3231
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.122727
出版商: AIP
数据来源: AIP
摘要:
Images of nanometer-scale ferroelectric domains inBaxSr1−xTiO3thin films are obtained with 30 Å spatial resolution using apertureless near-field scanning optical microscopy (ANSOM). The images exhibit inhomogeneities in the ferroelectric polarization over the smallest scales that can be observed, and are largely uncorrelated with topographic features. The application of an in-plane static electric field causes domain reorientation and domain-wall motion over distances as small as 40 Å. These results demonstrate the promise of ANSOM for imaging near-atomic-scale polarization fluctuations in ferroelectric materials. ©1998 American Institute of Physics.
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