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Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy

 

作者: Charles Hubert,   Jeremy Levy,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 22  

页码: 3229-3231

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122727

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Images of nanometer-scale ferroelectric domains inBaxSr1−xTiO3thin films are obtained with 30 Å spatial resolution using apertureless near-field scanning optical microscopy (ANSOM). The images exhibit inhomogeneities in the ferroelectric polarization over the smallest scales that can be observed, and are largely uncorrelated with topographic features. The application of an in-plane static electric field causes domain reorientation and domain-wall motion over distances as small as 40 Å. These results demonstrate the promise of ANSOM for imaging near-atomic-scale polarization fluctuations in ferroelectric materials. ©1998 American Institute of Physics.

 

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