Local determination of the stacking sequence of layered materials
作者:
J. Fompeyrine,
R. Berger,
H. P. Lang,
J. Perret,
E. Ma¨chler,
Ch. Gerber,
J.-P. Locquet,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 14
页码: 1697-1699
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121155
出版商: AIP
数据来源: AIP
摘要:
The ability to modify the stacking sequence of ultrathin films offers a unique way to change either the interaction strength or the doping, but demands a careful control of each atomic monolayer. Progress is hampered by the lack of a direct method that allows differentiation on a local scale between the various terminating layers of a crystal. Here, the combination of a vacuum annealing process and friction force microscopy reveals this local distinction on aSrTiO3surface. Using the friction contrast, we find how the terminating layer of a single crystal profoundly influences the terrace edge structure. ©1998 American Institute of Physics.
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