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Local determination of the stacking sequence of layered materials

 

作者: J. Fompeyrine,   R. Berger,   H. P. Lang,   J. Perret,   E. Ma¨chler,   Ch. Gerber,   J.-P. Locquet,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 14  

页码: 1697-1699

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121155

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The ability to modify the stacking sequence of ultrathin films offers a unique way to change either the interaction strength or the doping, but demands a careful control of each atomic monolayer. Progress is hampered by the lack of a direct method that allows differentiation on a local scale between the various terminating layers of a crystal. Here, the combination of a vacuum annealing process and friction force microscopy reveals this local distinction on aSrTiO3surface. Using the friction contrast, we find how the terminating layer of a single crystal profoundly influences the terrace edge structure. ©1998 American Institute of Physics.

 

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