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Water degradation ofa- andc-axis orientedHgBa2CaCu2Oxsuperconducting thin films

 

作者: S. H. Yun,   U. O. Karlsson,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 12  

页码: 6348-6350

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.366526

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Degradation ofHgBa2CaCu2Oxsuperconducting thin films witha- andc-axis oriented normal to the substrates in water has been studied with electrical measurement, x-ray diffractometry, scanning electron microscopy, and energy dispersive x-ray spectrometry. We observed the different degradation behavior ofa- andc-axis orientedHgBa2CaCu2Oxthin films normal to substrates in water immersion experiments. Thea-axis oriented films are much more stable than thec-axis oriented films in water. After a 60 min immersion, the zero-resistance temperature of thea-axis oriented film is still above 110 K, but the zero resistance is not observed in thec-axis oriented film in water even for 5 min. The intensity of(00l)peaks is suppressed at one order of magnitude faster than that of(l00)peaks as the total immersion time increase. ©1997 American Institute of Physics.

 

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