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Technique for shaping scanning tunneling microscope tips

 

作者: P. J. Bryant,   H. S. Kim,   Y. C. Zheng,   R. Yang,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1987）
卷期: Volume 58, issue 6  

页码: 1115-1115

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139618

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Two innovations have been applied to improve a method developed earlier for the production of field‐ion tips. The new technique produces sharper, smaller tips with low‐aspect ratio shanks to fulfill the specific needs of scanning tunneling microscopy.

 

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