Work function measurements using an improved thermionic projection microscope
作者:
C. H. Hinrichs,
W. A. Mackie,
Ira Cohen,
Jack Alin,
Don Schnitzler,
Ian Noel,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 12
页码: 3689-3696
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144493
出版商: AIP
数据来源: AIP
摘要:
A quantitative thermionic projection microscope, employing computer image processing, is described. In this system, thermionic emission from a single‐crystal hemispherical cathode is projected onto a phosphor screen and the resulting image is digitized by means of a video camera. Single‐plane effective work functions for the highest emitting planes of the cathode may be measured to within a tenth of an electron volt. ©1994 American Institute of Physics.
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