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Work function measurements using an improved thermionic projection microscope

 

作者: C. H. Hinrichs,   W. A. Mackie,   Ira Cohen,   Jack Alin,   Don Schnitzler,   Ian Noel,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 12  

页码: 3689-3696

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144493

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A quantitative thermionic projection microscope, employing computer image processing, is described. In this system, thermionic emission from a single‐crystal hemispherical cathode is projected onto a phosphor screen and the resulting image is digitized by means of a video camera. Single‐plane effective work functions for the highest emitting planes of the cathode may be measured to within a tenth of an electron volt. ©1994 American Institute of Physics.

 

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