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A 40-nm-pitch double-slit experiment of hot electrons in a semiconductor under a magnetic field

 

作者: Hiroo Hongo,   Yasuyuki Miyamoto,   Kazuhito Furuya,   Michihiko Suhara,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 1  

页码: 93-95

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119318

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report a double-slit experiment of hot electrons in a semiconductor under a magnetic field. The pitch of the double slit buried in the semiconductor is 40 nm and the electron energy is of the order of 100 meV. By applying a magnetic field, the change in current that passes through the slits is observed at the segmented collector. The measured current shows a clear minimum aroundB=0 T, with this behavior agreeing with a theoretical calculation based on double-slit interference. Quantitative estimation is consistent with this order of current variation. We think that these results show evidence of the observation of hot electron interference by a double slit in a semiconductor. ©1997 American Institute of Physics.

 

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