A 40-nm-pitch double-slit experiment of hot electrons in a semiconductor under a magnetic field
作者:
Hiroo Hongo,
Yasuyuki Miyamoto,
Kazuhito Furuya,
Michihiko Suhara,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 1
页码: 93-95
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119318
出版商: AIP
数据来源: AIP
摘要:
We report a double-slit experiment of hot electrons in a semiconductor under a magnetic field. The pitch of the double slit buried in the semiconductor is 40 nm and the electron energy is of the order of 100 meV. By applying a magnetic field, the change in current that passes through the slits is observed at the segmented collector. The measured current shows a clear minimum aroundB=0 T, with this behavior agreeing with a theoretical calculation based on double-slit interference. Quantitative estimation is consistent with this order of current variation. We think that these results show evidence of the observation of hot electron interference by a double slit in a semiconductor. ©1997 American Institute of Physics.
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