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Transferred‐electron induced current instabilities in heterojunction bipolar transistors

 

作者: V. A. Posse,   B. Jalali,   A. F. J. Levi,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 24  

页码: 3319-3321

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113743

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Current driven instabilities in the collector of III–V heterojunction bipolar transistors (HBT) are investigated. Numerical simulations indicate that in a modified AlGaAs/GaAs HBT the collector current shows oscillatory behavior due to the transferred‐electron (Gunn–Hilsum) effect. Influence of the Kirk effect as well as conditions for oscillation are discussed. ©1995 American Institute of Physics.

 

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